دانلود کتاب Electrical Atomic Force Microscopy for Nanoelectronics

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Front Matter ....Pages i-xx
The Atomic Force Microscopy for Nanoelectronics (Umberto Celano)....Pages 1-28
Conductive AFM for Nanoscale Analysis of High-k Dielectric Metal Oxides (Christian Rodenbücher, Marcin Wojtyniak, Kristof Szot)....Pages 29-70
Mapping Conductance and Carrier Distributions in Confined Three-Dimensional Transistor Structures (Andreas Schulze, Pierre Eyben, Jay Mody, Kristof Paredis, Lennaert Wouters, Umberto Celano et al.)....Pages 71-106
Scanning Capacitance Microscopy for Two-Dimensional Carrier Profiling of Semiconductor Devices (Jay Mody, Jochonia Nxumalo)....Pages 107-142
Oxidation and Thermal Scanning Probe Lithography for High-Resolution Nanopatterning and Nanodevices (Yu Kyoung Ryu, Armin Wolfgang Knoll)....Pages 143-172
Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique (Simon Martin, Brice Gautier, Nicolas Baboux, Alexei Gruverman, Adrian Carretero-Genevrier, Martí Gich et al.)....Pages 173-203
Electrical AFM for the Analysis of Resistive Switching (Stefano Brivio, Jacopo Frascaroli, Min Hwan Lee)....Pages 205-229
Magnetic Force Microscopy for Magnetic Recording and Devices (Atsufumi Hirohata, Marjan Samiepour, Marco Corbetta)....Pages 231-265
Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM (Christina Villeneuve-Faure, Kremena Makasheva, Laurent Boudou, Gilbert Teyssedre)....Pages 267-301
Conductive AFM of 2D Materials and Heterostructures for Nanoelectronics (Filippo Giannazzo, Giuseppe Greco, Fabrizio Roccaforte, Chandreswar Mahata, Mario Lanza)....Pages 303-350
Diamond Probes Technology (Thomas Hantschel, Thierry Conard, Jason Kilpatrick, Graham Cross)....Pages 351-384
Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials (Kurt A. Rubin, Yongliang Yang, Oskar Amster, David A. Scrymgeour, Shashank Misra)....Pages 385-408