دانلود کتاب Neutron Transmutation Doping in Semiconductors

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Front Matter....Pages i-x
The NTD Process—A New Reactor Technology....Pages 1-10
Detection and Identification of Potential Impurities Activated by Neutron Irradiation of Czochralski Silicon....Pages 11-26
Nuclear Transmutation Doping from the Viewpoint of Radioactivity Formation....Pages 27-36
Application of NTD Silicon for Power Devices....Pages 37-45
The Advantages of NTD Silicon for High Power Semiconductor Devices....Pages 47-52
NTD Silicon on High Power Devices....Pages 53-63
Role of Neutron Transmutation in the Development of High Sensitivity Extrinsic Silicon IR Detector Material....Pages 65-90
Study of the Spatial Characteristics of the Breakdown Process in Silicon PN-Junctions....Pages 91-108
Resistivity Fluctuations in Highly Compensated NTD Silicon....Pages 109-128
Transistor Gain Trimming in I 2 L Integrated Circuits Using the NTD Process....Pages 129-141
Determination of the Neutron Flux and Energy Spectrum and Calculation of Primary Recoil and Damage-Energy Distributions for Materials Irradiated in the Low Temperature Fast-Neutron Facility in CP-5....Pages 143-155
Neutron Doping of Silicon in the Harwell Research Reactors....Pages 157-163
Silicon Irradiation Facilities at the NBS Reactor....Pages 165-170
General Electric Test Reactor NTD Silicon Development Program....Pages 171-179
An Automated Irradiation Facility for Neutron Doping of Large Silicon Ingots....Pages 181-195
High Precision Irradiation Techniques for NTD Silicon at the University of Missouri Research Reactor....Pages 197-214
A Computer Controlled Irradiation System for the University of Missouri Research Reactor....Pages 215-228
Atomic Displacement Effects in Neutron Transmutation Doping....Pages 229-248
The Minority Carrier Lifetime of Neutron Doped Silicon....Pages 249-259
Electrical Property Studies of Neutron Transmutation Doped Silicon....Pages 261-279
Defect Annealing Studies in Neutron Transmutation Doped Silicon....Pages 281-290
Isochronal Annealing of Resistivity in Float Zone and Czochralski NTD Silicon....Pages 291-305
Electron Spin Resonance in NTD Silicon....Pages 307-316
Defect Levels Controlling the Behavior of NTD Silicon During Annealing....Pages 317-328
Residual Radioactivity Measurements for High Purity Silicon Irradiated by Pile Neutrons....Pages 329-331
Magneto-Optical Study of Shallow Donors in Transmutation-Doped GaAs....Pages 333-333
Shallow Defect Levels in Neutron Irradiated Extrinsic P-Type Silicon....Pages 335-343
Measurements of 3 1 P Concentrations Produced by Neutron Transmutation Doping of Silicon....Pages 345-354
“Pursuit of the Ultimate Junction”....Pages 355-358
Back Matter....Pages 359-371