دانلود کتاب Structure Analysis of Advanced Nanomaterials: Nanoworld by High-Resolution Electron Microscopy

فهرست مطالب :

Preface\nContents\nTable for physical constants\n1 Introduction\n 1.1 Characteristic of electron microscopy\n 1.2 What information can be obtained by electron microscopy?\n 1.3 Various types of electron microscopy\n2 Structure and principle of electron microscopes\n 2.1 Structure of transmission electron microscope\n 2.2 Observation mechanism of atoms by electrons\n 2.3 Information from electron diffraction pattern\n 2.4 High-resolution electron microscopy\n 2.5 Scanning electron microscope\n 2.6 Electron energy-loss spectroscopy\n 2.7 Energy dispersive X-ray spectroscopy\n 2.8 High-angle annular dark-field scanning TEM\n 2.9 Electron holography and Lorentz microscopy\n 2.10 Image simulation\n3 Practice of HREM\n 3.1 Sample preparation\n 3.2 Specimen preparation methods\n 3.3 Structure analysis by X-ray diffraction\n 3.4 TEM observation\n 3.5 HREM observation\n 3.6 Fourier filtering\n 3.7 Resolution of HREM images\n 3.8 Prevention of damage and contamination\n 3.9 Taking images and reading data\n 3.10 Mental attitude for TEM\n4 Characterization by HREM\n 4.1 What information can be obtained?\n 4.2 Direct atomic observation\n 4.3 Crystallographic image processing\n 4.4 Comparison of HREM image with calculated images\n 4.5 Atomic coordinates from HREM image