دانلود کتاب ASME Boiler and Pressure Vessel Code: Nondestructive examination

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Table of Contents\nList of Sections\n INTERPRETATIONS\n CODE CASES\nForeword\nStatement of Policy on the Use of the Certification Mark and Code Authorization in Advertising\nStatement of Policy on the Use of ASME Marking to Identify Manufactured Items\nSubmittal of Technical Inquiries to the Boiler and Pressure Vessel Standards Committees\n 1 Introduction\n 2 Inquiry Format\n 3 Code Revisions or Additions\n 4 Code Cases\n 5 Code Interpretations\n 6 Submittals\nPersonnel\nASTM Personnel\nSummary of Changes\nList of Changes in Record Number Order\nCross-Referencing and Stylistic Changes in the Boiler and Pressure Vessel Code\n Subparagraph Breakdowns/Nested Lists Hierarchy\n Footnotes\n Submittal of Technical Inquiries to the Boiler and Pressure Vessel Standards Committees\n Cross-References\nSubsection A Nondestructive Methods of Examination\n Article 1 General Requirements\n T-110 Scope\n T-120 General\n T-130 Equipment\n T-150 Procedure\n T-160 Calibration\n T-170 Examinations and Inspections\n T-180 Evaluation\n T-190 Records/Documentation\n Mandatory Appendix I Glossary of Terms for Nondestructive Examination\n I-110 Scope\n I-120 General Requirements\n I-121 GENERAL TERMS\n I-130 UT — Ultrasonics\n Mandatory Appendix II Supplemental Personnel Qualification Requirements for NDE Certification\n II-110 Scope\n II-120 General Requirements\n II-121 LEVEL I AND LEVEL II TRAINING AND EXPERIENCE REQUIREMENTS\n II-122 LEVEL I AND LEVEL II EXAMINATIONS\n II-123 LEVEL III REQUIREMENTS\n II-124 TRAINING OUTLINES\n Nonmandatory Appendix A Imperfection vs Type of NDE Method\n A-110 Scope\n Article 2 Radiographic Examination\n T-210 Scope\n T-220 General Requirements\n T-221 Procedure Requirements\n T-222 Surface Preparation\n T-223 Backscatter Radiation\n T-224 System of Identification\n T-225 Monitoring Density Limitations of Radiographs\n T-226 Extent of Examination\n T-230 Equipment and Materials\n T-231 Film\n T-232 Intensifying Screens\n T-233 Image Quality Indicator (IQI) Design\n T-234 Facilities for Viewing of Radiographs\n T-260 Calibration\n T-261 Source Size\n T-262 Densitometer and Step Wedge Comparison Film\n T-270 Examination\n T-271 Radiographic Technique\n T-272 Radiation Energy\n T-273 Direction of Radiation\n T-274 Geometric Unsharpness\n T-275 Location Markers\n T-276 IQI Selection\n T-277 Use of IQIs to Monitor Radiographic Examination\n T-280 Evaluation\n T-281 Quality of Radiographs\n T-282 Radiographic Density\n T-283 IQI Sensitivity\n T-284 Excessive Backscatter\n T-285 Evaluation by Manufacturer\n T-290 Documentation\n T-291 Radiographic Technique Documentation Details\n T-292 Radiograph Review Form\n Mandatory Appendix I In-Motion Radiography\n I-210 Scope\n I-220 General Requirements\n I-223 Backscatter Detection Symbol Location\n I-260 Calibration\n I-263 Beam Width\n I-270 Examination\n I-274 Geometric and In-Motion Unsharpness\n I-275 Location Markers\n I-277 Placement and Number of IQIs\n I-279 Repaired Area\n Mandatory Appendix II Real-Time Radioscopic Examination\n II-210 Scope\n II-220 General Requirements\n II-221 Procedure Requirements\n II-230 Equipment and Materials\n II-231 Radioscopic Examination Record\n II-235 Calibration Block\n II-236 Calibrated Line Pair Test Pattern and Step Wedge\n II-237 Equivalent Performance Level\n II-260 Calibration\n II-263 System Performance Measurement\n II-264 Measurement With a Calibration Block\n II-270 Examination\n II-278 System Configuration\n II-280 Evaluation\n II-286 Factors Affecting System Performance\n II-290 Documentation\n II-291 Radioscopic Technique Information\n II-292 Evaluation by Manufacturer\n Mandatory Appendix III Digital Image Acquisition, Display, and Storage for Radiography and Radioscopy\n III-210 Scope\n III-220 General Requirements\n III-221 Procedure Requirements\n III-222 Original Image Artifacts\n III-230 Equipment and Materials\n III-231 Digital Image Examination Record\n III-234 Viewing Considerations\n III-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge\n III-250 Image Acquisition and Storage\n III-255 Area of Interest\n III-258 System Configuration\n III-260 Calibration\n III-263 System Performance Measurement\n III-280 Evaluation\n III-286 Factors Affecting System Performance\n III-287 System-Induced Artifacts\n III-290 Documentation\n III-291 Digital Imaging Technique Information\n III-292 Evaluation by Manufacturer\n Mandatory Appendix IV Interpretation, Evaluation, and Disposition of Radiographic and Radioscopic Examination Test Results Produced by the Digital Image Acquisition and Display Process\n IV-210 Scope\n IV-220 General Requirements\n IV-221 Procedure Requirements\n IV-222 Original Image Artifacts\n IV-230 Equipment and Materials\n IV-231 Digital Image Examination Record\n IV-234 Viewing Considerations\n IV-236 Calibrated Optical Line Pair Test Pattern and Optical Density Step Wedge\n IV-250 Image Acquisition, Storage, and Interpretation\n IV-255 Area of Interest\n IV-258 System Configuration\n IV-260 Calibration\n IV-263 System Performance Measurement\n IV-280 Evaluation\n IV-286 Factors Affecting System Performance\n IV-287 System-Induced Artifacts\n IV-290 Documentation\n IV-291 Digital Imaging Technique Information\n IV-292 Evaluation by Manufacturer\n Mandatory Appendix V Glossary of Terms for Radiographic Examination\n Mandatory Appendix VI Acquisition, Display, Interpretation, and Storage of Digital Images of Radiographic Film for Nuclear Applications\n VI-210 Scope\n VI-220 General Requirements\n VI-221 Supplemental Requirements\n VI-222 Written Procedure\n VI-223 Personnel Requirements\n VI-230 Equipment and Materials\n VI-231 System Features\n VI-232 System Spot Size\n VI-240 System Performance Requirements\n VI-241 Spatial Resolution\n VI-242 Contrast Sensitivity\n VI-243 Dynamic Range\n VI-244 Spatial Linearity\n VI-250 Technique\n VI-251 Spatial Resolution Evaluation\n VI-252 Contrast Sensitivity Evaluation\n VI-253 Dynamic Range Evaluation\n VI-254 Spatial Linearity Evaluation\n VI-260 Demonstration of System Performance\n VI-261 Procedure Demonstration\n VI-262 Processed Targets\n VI-263 Changes in Essential Variables\n VI-264 Frequency of Verification\n VI-265 Changes in System Performance\n VI-270 Examination\n VI-271 System Performance Requirements\n VI-272 Artifacts\n VI-273 Calibration\n VI-280 Evaluation\n VI-281 Process Evaluation\n VI-282 Interpretation\n VI-283 Baseline\n VI-290 Documentation\n VI-291 Reporting Requirements\n VI-292 Archiving\n Mandatory Appendix VI Supplement A\n VI-A-210 Scope\n VI-A-220 General\n VI-A-221 Reference Film\n VI-A-230 Equipment and Materials\n VI-A-231 Reference Targets\n VI-A-232 Spatial Resolution Targets\n VI-A-233 Constrast Sensitivity Targets\n VI-A-234 Dynamic Range Targets\n VI-A-235 Spatial Linearity Targets\n VI-A-240 Miscellaneous Requirements\n VI-A-241 Material\n VI-A-242 Film Size\n VI-A-243 Spatial Resolution\n VI-A-244 Density\n VI-A-245 Linearity\n Mandatory Appendix VII Radiographic Examination of Metallic Castings\n VII-210 Scope\n VII-220 General Requirements\n VII-224 System of Identification\n VII-270 Examination\n VII-271 Radiographic Technique\n VII-276 IQI Selection\n VII-280 Evaluation\n VII-282 Radiographic Density\n VII-290 Documentation\n VII-293 Layout Details\n Mandatory Appendix VIII Radiography Using Phosphor Imaging Plate\n VIII-210 Scope\n VIII-220 General Requirements\n VIII-221 Procedure Requirements\n VIII-225 Monitoring Density Limitations of Radiographs\n VIII-230 Equipment and Materials\n VIII-231 Phosphor Imaging Plate\n VIII-234 Facilities for Viewing of Radiographs\n VIII-260 Calibration\n VIII-262 Densitometer and Step Wedge Comparison Film\n VIII-270 Examination\n VIII-277 Use of IQIs to Monitor Radiographic Examination\n VIII-280 Evaluation\n VIII-281 System-Induced Artifacts\n VIII-282 Image Brightness\n VIII-283 IQI Sensitivity\n VIII-284 Excessive Backscatter\n VIII-287 Dimensional Measuring\n VIII-288 Interpretation\n VIII-290 Documentation\n VIII-291 Digital Imaging Technique Documentation Details\n Mandatory Appendix IX Radiography Using Digital Detector Systems\n IX-210 Scope\n IX-220 General Requirements\n IX-221 Procedure Requirements\n IX-225 Monitoring Density Limitations of Radiographs\n IX-230 Equipment and Materials\n IX-231 Film\n IX-232 Intensifying Screens\n IX-234 Facilities for Viewing of Radiographs\n IX-260 Calibration\n IX-262 Densitometer and Step Wedge Comparison Film\n IX-263 Beam Width\n IX-270 Examination\n IX-274 Geometric and In-Motion Unsharpness\n IX-275 Location Markers\n IX-277 Use of IQIs to Monitor Radiographic Examination\n IX-280 Evaluation\n IX-281 Quality of Digital Images\n IX-282 Image Brightness\n IX-283 IQI Sensitivity\n IX-284 Excessive Backscatter\n IX-287 Dimensional Measuring\n IX-288 Interpretation\n IX-290 Documentation\n IX-291 Digital Imaging Technique Documentation Details\n Nonmandatory Appendix A Recommended Radiographic Technique Sketches for Pipe or Tube Welds\n A-210 Scope\n Nonmandatory Appendix C Hole-Type IQI Placement Sketches for Welds\n C-210 Scope\n Nonmandatory Appendix D Number of IQIs (Special Cases)\n D-210 Scope\n Article 4 Ultrasonic Examination Methods for Welds\n T-410 Scope\n T-420 General\n T-421 Written Procedure Requirements\n T-430 Equipment\n T-431 Instrument Requirements\n T-432 Search Units\n T-433 Couplant\n T-434 Calibration Blocks\n T-440 Miscellaneous Requirements\n T-441 Identification of Weld Examination Areas\n T-450 Techniques\n T-451 Coarse Grain Materials\n T-452 Computerized Imaging Techniques\n T-453 Scanning Techniques\n T-460 Calibration\n T-461 Instrument Linearity Checks\n T-462 General Calibration Requirements\n T-463 Calibration for Nonpiping\n T-464 Calibration for Piping\n T-465 Calibration for Weld Metal Overlay Cladding\n T-466 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal\n T-467 Calibration Confirmation\n T-470 Examination\n T-471 General Examination Requirements\n T-472 Weld Joint Distance–Amplitude Technique\n T-473 Weld Metal Overlay Cladding Techniques\n T-474 Nondistance–Amplitude Techniques\n T-475 Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal\n T-477 Post-Examination Cleaning\n T-480 Evaluation\n T-481 General\n T-482 Evaluation Level\n T-483 Evaluation of Laminar Reflectors\n T-484 Alternative Evaluations\n T-490 Documentation\n T-491 Recording Indications\n T-492 Examination Records\n T-493 Report\n T-494 Storage Media\n Mandatory Appendix I Screen Height Linearity\n I-410 Scope\n I-440 Miscellaneous Requirements\n Mandatory Appendix II Amplitude Control Linearity\n II-410 Scope\n II-440 Miscellaneous Requirements\n Mandatory Appendix III Time of Flight Diffraction (TOFD) Technique\n III-410 Scope\n III-420 General\n III-421 Written Procedure Requirements\n III-430 Equipment\n III-431 Instrument Requirements\n III-432 Search Units\n III-434 Calibration Blocks\n III-435 Mechanics\n III-460 Calibration\n III-463 Calibration\n III-464 Calibration for Piping\n III-465 Calibration for Cladding\n III-467 Encoder Confirmation\n III-470 Examination\n III-471 General Examination Requirements\n III-472 Weld Joint Distance–Amplitude Technique\n III-473 Cladding Technique\n III-475 Data Sampling Spacing\n III-480 Evaluation\n III-485 Missing Data Lines\n III-486 Flaw Sizing and Interpretation\n III-490 Documentation\n III-492 Examination Record\n III-493 Report\n Mandatory Appendix IV Phased Array Manual Raster Examination Techniques Using Linear Arrays\n IV-410 Scope\n IV-420 General\n IV-421 Written Procedure Requirements\n IV-460 Calibration\n IV-461 Instrument Linearity Checks\n IV-462 General Calibration Requirements\n IV-490 Documentation\n IV-492 Examination Record\n Mandatory Appendix V Phased Array E-Scan and S-Scan Linear Scanning Examination Techniques\n V-410 Scope\n V-420 General\n V-421 Written Procedure Requirements\n V-422 Scan Plan\n V-460 Calibration\n V-461 Instrument Linearity Checks\n V-462 General Calibration Requirements\n V-467 Encoder Calibration\n V-470 Examination\n V-471 General Examination Requirements\n V-490 Documentation\n V-492 Examination Record\n Mandatory Appendix VII Ultrasonic Examination Requirements for Workmanship-Based Acceptance Criteria\n VII-410 Scope\n VII-420 General\n VII-421 Written Procedure Requirements\n VII-423 Personnel Qualifications\n VII-430 Equipment\n VII-431 Instrument Requirements\n VII-434 Calibration Blocks\n VII-440 Miscellaneous Requirements\n VII-442 Scanning Data\n VII-460 Calibration\n VII-466 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal\n VII-470 Examination\n VII-471 General Examination Requirements\n VII-480 Evaluation\n VII-483 Evaluation of Laminar Reflectors\n VII-485 Evaluation\n VII-486 Supplemental Manual Techniques\n VII-487 Evaluation by Manufacturer\n VII-490 Documentation\n VII-492 Examination Record\n Mandatory Appendix VIII Ultrasonic Examination Requirements for Fracture-Mechanics-Based Acceptance Criteria\n VIII-410 Scope\n VIII-420 General\n VIII-421 Written Procedure Requirements\n VIII-423 Personnel Qualifications\n VIII-430 Equipment\n VIII-431 Instrument Requirements\n VIII-432 Search Units\n VIII-434 Calibration Blocks\n VIII-440 Miscellaneous Requirements\n VIII-442 Scanning Data\n VIII-460 Calibration\n VIII-467 Calibration for Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal\n VIII-470 Examination\n VIII-471 General Examination Requirements\n VIII-480 Evaluation\n VIII-482 Evaluation Level\n VIII-483 Evaluation of Laminar Reflectors\n VIII-485 Evaluation Settings\n VIII-486 Size and Category\n VIII-487 Supplemental Manual Techniques\n VIII-488 Evaluation by Manufacturer\n VIII-490 Documentation\n VIII-492 Examination Records\n Mandatory Appendix IX Procedure Qualification Requirements for Flaw Sizing and Categorization\n IX-410 Scope\n IX-420 General\n IX-430 Equipment\n IX-435 Demonstration Blocks\n IX-440 Miscellaneous Requirements\n IX-442 Qualification Data\n IX-480 Evaluation\n IX-481 Size and Category\n IX-482 Automated and Semiautomated Acceptable Performance Criteria\n IX-483 Supplemental Manual Technique(s) Acceptable Performance\n IX-490 Documentation\n IX-492 Demonstration Block Record\n Mandatory Appendix X Ultrasonic Examination of High Density Polyethylene\n X-410 Scope\n X-420 General\n X-421 Written Procedure Requirements\n X-422 Scan Plan\n X-430 Equipment\n X-431 Instrument Requirements\n X-432 Search Units\n X-434 Calibration Blocks\n X-460 Calibration\n X-462 General Calibration Requirements\n X-464 Calibration for Piping\n X-467 Calibration Confirmation\n X-470 Examination\n X-471 General Examination Requirements\n X-490 Documentation\n X-492 Examination Record\n Nonmandatory Appendix A Layout of Vessel Reference Points\n A-410 Scope\n A-440 Miscellaneous Requirements\n A-441 Circumferential (Girth) Welds\n A-442 Longitudinal Welds\n A-443 Nozzle-to-Vessel Welds\n Nonmandatory Appendix B General Techniques for Angle Beam Calibrations\n B-410 Scope\n B-460 Calibration\n B-461 Sweep Range Calibration\n B-462 Distance–Amplitude Correction\n B-463 Distance–Amplitude Correction Inner 1/4 Volume (See Nonmandatory Appendix J, Figure J-431 View A)\n B-464 Position Calibration (See Figure B-464)\n B-465 Calibration Correction for Planar Reflectors Perpendicular to the Examination Surface at or Near the Opposite Surface (See Figure B-465)\n B-466 Beam Spread (See Figure B-466)\n Nonmandatory Appendix C General Techniques for Straight Beam Calibrations\n C-410 Scope\n C-460 Calibration\n C-461 Sweep Range Calibration (See Figure C-461)\n C-462 Distance–Amplitude Correction (See Figure C-462)\n Nonmandatory Appendix D Examples of Recording Angle Beam Examination Data\n D-410 Scope\n D-420 General\n D-470 Examination Requirements\n D-471 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level\n D-472 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level\n D-473 Flaw Sizing Techniques to Be Qualified and Demonstrated\n D-490 Documentation\n D-491 Reflectors With Indication Amplitudes Greater Than 20% of DAC or Reference Level\n D-492 Reflectors With Indication Amplitudes Greater Than the DAC Curve or Reference Level\n D-493 Reflectors That Require Measurement Techniques to Be Qualified and Demonstrated\n Nonmandatory Appendix E Computerized Imaging Techniques\n E-410 Scope\n E-420 General\n E-460 Calibration\n E-470 Examination\n E-471 Synthetic Aperture Focusing Technique for Ultrasonic Testing (SAFT-UT)\n E-472 Line-Synthetic Aperture Focusing Technique (L-SAFT)\n E-473 Broadband Holography Technique\n E-474 UT-Phased Array Technique\n E-475 UT-Amplitude Time-of-Flight Locus-Curve Analysis Technique\n E-476 Automated Data Acquisition and Imaging Technique\n Nonmandatory Appendix G Alternate Calibration Block Configuration\n G-410 Scope\n G-460 Calibration\n G-461 Determination of Gain Correction\n Nonmandatory Appendix I Examination of Welds Using Angle Beam Search Units\n I-410 Scope\n I-470 Examination\n I-471 General Scanning Requirements\n I-472 Exceptions to General Scanning Requirements\n I-473 Examination Coverage\n Nonmandatory Appendix J Alternative Basic Calibration Block\n J-410 Scope\n J-430 Equipment\n J-431 Basic Calibration Block\n J-432 Basic Calibration Block Material\n J-433 Calibration Reflectors\n Nonmandatory Appendix K Recording Straight Beam Examination Data for Planar Reflectors\n K-410 Scope\n K-470 Examination\n K-471 Overlap\n K-490 Records/Documentation\n Nonmandatory Appendix L TOFD Sizing Demonstration/Dual Probe — Computer Imaging Technique\n L-410 Scope\n L-420 General\n L-430 Equipment\n L-431 System\n L-432 Demonstration Block\n L-460 Calibration\n L-461 System\n L-462 System Checks\n L-470 Examination\n L-480 Evaluation\n L-481 Sizing Determinations\n L-482 Sizing Accuracy Determinations\n L-483 Classification/Sizing System\n L-490 Documentation\n L-491 Demonstration Report\n Nonmandatory Appendix M General Techniques for Angle Beam Longitudinal Wave Calibrations\n M-410 Scope\n M-460 Calibration\n M-461 Sweep Range Calibration\n M-462 Distance–Amplitude Correction (DAC) (See Figure M-462)\n Nonmandatory Appendix N Time of Flight Diffraction (TOFD) Interpretation\n N-410 Scope\n N-420 General\n N-421 TOFD Images — Data Visualization\n N-450 Procedure\n N-451 Measurement Tools\n N-452 Flaw Position Errors\n N-453 Measuring Flaw Length\n N-454 Measuring Flaw Depth\n N-480 Evaluation\n N-481 Single Flaw Images\n N-482 Multiple Flaw Images\n N-483 Typical Problems With TOFD Interpretation\n Nonmandatory Appendix O Time of Flight Diffraction (TOFD) Technique — General Examination Configurations\n O-410 Scope\n O-430 Equipment\n O-432 Search Units\n O-470 Examination\n Nonmandatory Appendix P Phased Array (PAUT) Interpretation\n P-410 Scope\n P-420 General\n P-421 PAUT Images — Data Visualization\n P-450 Procedure\n P-451 Measurement Tools\n P-452 Flaw Sizing Techniques\n P-480 Evaluation\n P-481 I.D. (Inside Diameter) Connected Crack\n Nonmandatory Appendix Q Example of a Split DAC Curve\n Q-410 Scope\n Q-420 General\n Q-421 First DAC\n Q-422 Second DAC\n Q-423 Notch Reflectors\n Nonmandatory Appendix R Straight Beam Calibration Blocks for Restricted Access Weld Examinations\n R-410 Scope\n R-420 General\n R-430 Equipment\n R-434 Calibration Blocks\n Article 5 Ultrasonic Examination Methods for Materials\n T-510 Scope\n T-520 General\n T-521 Basic Requirements\n T-522 Written Procedure Requirements\n T-530 Equipment\n T-531 Instrument\n T-532 Search Units\n T-533 Couplant\n T-534 Calibration Block Requirements\n T-560 Calibration\n T-561 Instrument Linearity Checks\n T-562 General Calibration Requirements\n T-563 Calibration Confirmation\n T-564 Casting Calibration for Supplementary Angle Beam Examinations\n T-570 Examination\n T-571 Examination of Product Forms\n T-572 Examination of Pumps and Valves\n T-573 Inservice Examination\n T-574 Thickness Measurement\n T-577 Post-Examination Cleaning\n T-580 Evaluation\n T-590 Documentation\n T-591 Recording Indications\n T-592 Examination Records\n T-593 Report\n T-594 Storage Media\n Mandatory Appendix I Ultrasonic Examination of Pumps and Valves\n I-510 Scope\n I-530 Equipment\n I-531 Calibration Blocks\n I-560 Calibration\n I-561 System Calibration\n I-570 Examination\n Mandatory Appendix II Inservice Examination of Nozzle Inside Corner Radius and Inner Corner Regions\n II-510 Scope\n II-530 Equipment\n II-531 Calibration Blocks\n II-560 Calibration\n II-561 System Calibration\n II-570 Examination\n Mandatory Appendix III Glossary of Terms for Ultrasonic Examination\n Mandatory Appendix IV Inservice Examination of Bolts\n IV-510 Scope\n IV-530 Equipment\n IV-531 Calibration Blocks\n IV-560 Calibration\n IV-561 DAC Calibration\n IV-570 Examination\n IV-571 General Examination Requirements\n Article 6 Liquid Penetrant Examination\n T-610 Scope\n T-620 General\n T-621 Written Procedure Requirements\n T-630 Equipment\n T-640 Miscellaneous Requirements\n T-641 Control of Contaminants\n T-642 Surface Preparation\n T-643 Drying After Preparation\n T-650 Technique\n T-651 Techniques\n T-652 Techniques for Standard Temperatures\n T-653 Techniques for Nonstandard Temperatures\n T-654 Technique Restrictions\n T-660 Calibration\n T-670 Examination\n T-671 Penetrant Application\n T-672 Penetration (Dwell) Time\n T-673 Excess Penetrant Removal\n T-674 Drying After Excess Penetrant Removal\n T-675 Developing\n T-676 Interpretation\n T-677 Post-Examination Cleaning\n T-680 Evaluation\n T-690 Documentation\n T-691 Recording of Indications\n T-692 Examination Records\n Mandatory Appendix I Glossary of Terms for Liquid Penetrant Examination\n Mandatory Appendix II Control of Contaminants for Liquid Penetrant Examination\n II-610 Scope\n II-640 Requirements\n II-641 Nickel Base Alloys\n II-642 Austenitic or Duplex Stainless Steel and Titanium\n II-643 Water\n II-690 Documentation\n Mandatory Appendix III Qualification Techniques for Examinations at Nonstandard Temperatures\n III-610 Scope\n III-630 Materials\n III-640 Requirements\n III-641 Comparator Application\n Article 7 Magnetic Particle Examination\n T-710 Scope\n T-720 General\n T-721 Written Procedure Requirements\n T-730 Equipment\n T-731 Examination Medium\n T-740 Miscellaneous Requirements\n T-741 Surface Conditioning\n T-750 Technique\n T-751 Techniques\n T-752 Prod Technique\n T-753 Longitudinal Magnetization Technique\n T-754 Circular Magnetization Technique\n T-755 Yoke Technique\n T-756 Multidirectional Magnetization Technique\n T-760 Calibration\n T-761 Frequency of Calibration\n T-762 Lifting Power of Yokes\n T-763 Gaussmeters\n T-764 Magnetic Field Adequacy and Direction\n T-765 Wet Particle Concentration and Contamination\n T-766 System Performance of Horizontal Units\n T-770 Examination\n T-771 Preliminary Examination\n T-772 Direction of Magnetization\n T-773 Method of Examination\n T-774 Examination Coverage\n T-775 Rectified Current\n T-776 Excess Particle Removal\n T-777 Interpretation\n T-778 Demagnetization\n T-779 Post-Examination Cleaning\n T-780 Evaluation\n T-790 Documentation\n T-791 Multidirectional Magnetization Technique Sketch\n T-792 Recording of Indications\n T-793 Examination Records\n Mandatory Appendix I Magnetic Particle Examination Using the AC Yoke Technique on Ferromagnetic Materials Coated With Nonferromagnetic Coatings\n I-710 Scope\n I-720 General\n I-721 Written Procedure Requirements\n I-722 Personnel Qualification\n I-723 Procedure/Technique Demonstration\n I-730 Equipment\n I-740 Miscellaneous Requirements\n I-741 Coating Thickness Measurement\n I-750 Technique\n I-751 Technique Qualification\n I-760 Calibration\n I-761 Yoke Maximum Lifting Force\n I-762 Light Intensity Measurement\n I-770 Examination\n I-780 Evaluation\n I-790 Documentation\n I-791 Examination Record\n Mandatory Appendix II Glossary of Terms for Magnetic Particle Examination\n Mandatory Appendix III Magnetic Particle Examination Using the Yoke Technique With Fluorescent Particles in an Undarkened Area\n III-710 Scope\n III-720 General\n III-721 Written Procedure Requirements\n III-723 Procedure Demonstration\n III-750 Technique\n III-751 Qualification Standard\n III-760 Calibration\n III-761 Black Light Intensity Measurement\n III-762 White Light Intensity Measurement\n III-770 Examination\n III-777 Interpretation\n III-790 Documentation\n III-791 Examination Record\n Mandatory Appendix IV Qualification of Alternate Wavelength Light Sources for Excitation of Fluorescent Particles\n IV-710 Scope\n IV-720 General\n IV-721 Written Procedure Requirements\n IV-723 Procedure Demonstration\n IV-750 Technique\n IV-751 Qualification Standard\n IV-752 Filter Glasses\n IV-770 Qualification Examinations\n IV-771 Black Light Intensity\n IV-772 Examination Requirements\n IV-773 Qualification of Alternate Wavelength Light Source and Specific Particles\n IV-790 Documentation\n IV-791 Examination Record\n Mandatory Appendix V Requirements for the Use of Magnetic Rubber Techniques\n V-710 Scope\n V-720 General Requirements\n V-721 Written Procedure Requirements\n V-730 Equipment\n V-731 Magnetizing Apparatus\n V-732 Magnetic Rubber Materials\n V-733 Magnetic Field Strength\n V-734 Magnification\n V-740 Miscellaneous Requirements\n V-741 Surface Preparation\n V-742 Taping and Damming\n V-743 Release Treatment\n V-750 Techniques\n V-751 Techniques\n V-752 Application of Magnetic Field\n V-760 Calibration\n V-764 Magnetic Field Adequacy and Direction\n V-770 Examination\n V-773 Application of Liquid Polymer-Magnetic Particle Material\n V-774 Movement During Cure\n V-776 Removal of Replicas\n V-780 Evaluation\n V-790 Documentation\n V-793 Examination Records\n Nonmandatory Appendix A Measurement of Tangential Field Strength With Gaussmeters\n A-710 Scope\n A-720 General Requirements\n A-730 Equipment\n A-750 Procedure\n A-790 Documentation/Records\n Article 8 Eddy Current Examination\n T-810 Scope\n Mandatory Appendix I Glossary of Terms for Eddy Current Examination\n Mandatory Appendix II Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing\n II-810 Scope\n II-820 General\n II-821 Written Procedure Requirements\n II-822 Personnel Requirements\n II-830 Equipment\n II-840 Requirements\n II-860 Calibration\n II-870 Examination\n II-880 Evaluation\n II-890 Documentation\n Mandatory Appendix III Eddy Current Examination on Coated Ferromagnetic Materials\n III-810 Scope\n III-820 General\n III-821 Personnel Qualification\n III-822 Written Procedure Requirements\n III-823 Procedure Demonstration\n III-830 Equipment\n III-850 Technique\n III-860 Calibration\n III-870 Examination\n III-890 Documentation\n III-891 Examination Report\n III-893 Record Retention\n Mandatory Appendix IV External Coil Eddy Current Examination of Tubular Products\n IV-810 Scope\n IV-820 General\n IV-821 Performance\n IV-822 Personnel Qualification\n IV-823 Written Procedure Requirements\n IV-830 Equipment\n IV-831 Test Coils and Probes\n IV-832 Scanners\n IV-833 Reference Specimen\n IV-850 Technique\n IV-860 Calibration\n IV-861 Performance Verification\n IV-862 Calibration of Equipment\n IV-870 Examination\n IV-880 Evaluation\n IV-890 Documentation\n IV-891 Examination Reports\n IV-893 Record Retention\n Mandatory Appendix V Eddy Current Measurement of Nonconductive-Nonferromagnetic Coating Thickness on a Nonferromagnetic Metallic Material\n V-810 Scope\n V-820 General\n V-821 Written Procedure Requirements\n V-822 Personnel Qualification\n V-823 Procedure/Technique Demonstration\n V-830 Equipment\n V-831 Probes\n V-850 Technique\n V-860 Calibration\n V-870 Examination\n V-880 Evaluation\n V-890 Documentation\n V-891 Examination Report\n V-893 Record Retention\n Mandatory Appendix VI Eddy Current Detection and Measurement of Depth of Surface Discontinuities in Nonferromagnetic Metals With Surface Probes\n VI-810 Scope\n VI-820 General\n VI-821 Written Procedure Requirements\n VI-822 Personnel Qualification\n VI-823 Procedure/Technique Demonstration\n VI-830 Equipment\n VI-831 Probes\n VI-832 Reference Specimen\n VI-850 Technique\n VI-860 Calibration\n VI-870 Examination\n VI-880 Evaluation\n VI-890 Documentation\n VI-891 Examination Report\n VI-893 Record Retention\n Mandatory Appendix VII Eddy Current Examination of Ferromagnetic and Nonferromagnetic Conductive Metals to Determine If Flaws Are Surface Connected\n VII-810 Scope\n VII-820 General\n VII-821 Performance\n VII-822 Personnel Qualification\n VII-823 Written Procedure Requirements\n VII-830 Equipment\n VII-830.1 System Description\n VII-830.2 Surface Probes\n VII-830.3 Cables\n VII-830.4 Instrumentation\n VII-830.5 Reference Specimen\n VII-850 Technique\n VII-860 Calibration\n VII-861 General\n VII-862 Calibration Response\n VII-870 Examination\n VII-880 Evaluation\n VII-890 Documentation\n VII-891 Examination Report\n VII-892 Record Retention\n Mandatory Appendix VIII Eddy Current Examination of Nonferromagnetic Heat Exchanger Tubing\n VIII-810 Scope\n VIII-820 General\n VIII-821 Written Procedure Requirements\n VIII-830 Equipment\n VIII-831 Data Acquisition System\n VIII-832 Analog Data Acquisition System\n VIII-833 Digital Data Acquisition System\n VIII-834 Bobbin Coils\n VIII-850 Technique\n VIII-850.1 Probe Data Acquisition Speed\n VIII-850.2 Recording\n VIII-850.3 Automated Data Screening System\n VIII-860 Calibration\n VIII-861 Equipment Calibration\n VIII-862 Calibration Reference Standards\n VIII-863 Base Frequency\n VIII-864 Setup and Adjustment\n VIII-870 Examination\n VIII-880 Evaluation\n VIII-880.1 Data Evaluation\n VIII-880.2 Means of Determining Indication Depth\n VIII-880.3 Frequencies Used for Data Evaluation\n VIII-890 Documentation\n VIII-890.1 Reporting\n VIII-890.2 Support Members\n VIII-890.3 Records\n Article 9 Visual Examination\n T-910 Scope\n T-920 General\n T-921 Written Procedure Requirements\n T-922 Personnel Requirements\n T-923 Physical Requirements\n T-930 Equipment\n T-950 Technique\n T-951 Applications\n T-952 Direct Visual Examination\n T-953 Remote Visual Examination\n T-954 Translucent Visual Examination\n T-980 Evaluation\n T-990 Documentation\n T-991 Report of Examination\n T-993 Record Maintenance\n Mandatory Appendix I Glossary of Terms for Visual Examination\n Article 10 Leak Testing\n T-1010 Scope\n T-1020 General\n T-1021 Written Procedure Requirements\n T-1022 Referencing Code\n T-1030 Equipment\n T-1031 Gages\n T-1040 Miscellaneous Requirements\n T-1041 Cleanliness\n T-1042 Openings\n T-1043 Temperature\n T-1044 Pressure/Vacuum (Pressure Limits)\n T-1050 Procedure\n T-1051 Preliminary Leak Test\n T-1052 Test Sequence\n T-1060 Calibration\n T-1061 Pressure/Vacuum Gages\n T-1062 Temperature Measuring Devices\n T-1063 Calibration Leak Standards\n T-1070 Test\n T-1080 Evaluation\n T-1081 Acceptance Standards\n T-1090 Documentation\n T-1091 Test Report\n T-1092 Record Retention\n Mandatory Appendix I Bubble Test — Direct Pressure Technique\n I-1010 Scope\n I-1020 General\n I-1021 Written Procedure Requirements\n I-1030 Equipment\n I-1031 Gases\n I-1032 Bubble Solution\n I-1033 Immersion Bath\n I-1070 Test\n I-1071 Soak Time\n I-1072 Surface Temperature\n I-1073 Application of Solution\n I-1074 Immersion in Bath\n I-1075 Lighting and Visual Aids\n I-1076 Indication of Leakage\n I-1077 Posttest Cleaning\n I-1080 Evaluation\n I-1081 Leakage\n I-1082 Repair/Retest\n Mandatory Appendix II Bubble Test — Vacuum Box Technique\n II-1010 Scope\n II-1020 General\n II-1021 Written Procedure Requirements\n II-1030 Equipment\n II-1031 Bubble Solution\n II-1032 Vacuum Box\n II-1033 Vacuum Source\n II-1070 Test\n II-1071 Surface Temperature\n II-1072 Application of Solution\n II-1073 Vacuum Box Placement\n II-1074 Pressure (Vacuum) Retention\n II-1075 Vacuum Box Overlap\n II-1076 Lighting and Visual Aids\n II-1077 Indication of Leakage\n II-1078 Posttest Cleaning\n II-1080 Evaluation\n II-1081 Leakage\n II-1082 Repair/Retest\n Mandatory Appendix III Halogen Diode Detector Probe Test\n III-1010 Introduction and Scope\n III-1011 Alkali-Ion Diode (Heated Anode) Halogen Leak Detectors\n III-1012 Electron Capture Halogen Leak Detectors\n III-1020 General\n III-1021 Written Procedure Requirements\n III-1030 Equipment\n III-1031 Tracer Gas\n III-1032 Instrument\n III-1033 Calibration Leak Standards\n III-1060 Calibration\n III-1061 Standard Leak Size\n III-1062 Warm Up\n III-1063 Scanning Rate\n III-1064 Detection Time\n III-1065 Frequency and Sensitivity\n III-1070 Test\n III-1071 Location of Test\n III-1072 Concentration of Tracer Gas\n III-1073 Soak Time\n III-1074 Scanning Distance\n III-1075 Scanning Rate\n III-1076 Scanning Direction\n III-1077 Leakage Detection\n III-1078 Application\n III-1080 Evaluation\n III-1081 Leakage\n III-1082 Repair/Retest\n Mandatory Appendix IV Helium Mass Spectrometer Test — Detector Probe Technique\n IV-1010 Scope\n IV-1020 General\n IV-1021 Written Procedure Requirements\n IV-1030 Equipment\n IV-1031 Instrument\n IV-1032 Auxiliary Equipment\n IV-1033 Calibration Leak Standards\n IV-1060 Calibration\n IV-1061 Instrument Calibration\n IV-1062 System Calibration\n IV-1070 Test\n IV-1071 Location of Test\n IV-1072 Concentration of Tracer Gas\n IV-1073 Soak Time\n IV-1074 Scanning Distance\n IV-1075 Scanning Rate\n IV-1076 Scanning Direction\n IV-1077 Leakage Detection\n IV-1078 Application\n IV-1080 Evaluation\n IV-1081 Leakage\n IV-1082 Repair/Retest\n Mandatory Appendix V Helium Mass Spectrometer Test — Tracer Probe Technique\n V-1010 Scope\n V-1020 General\n V-1021 Written Procedure Requirements\n V-1030 Equipment\n V-1031 Instrument\n V-1032 Auxiliary Equipment\n V-1033 System Calibration Leak Standard\n V-1060 Calibration\n V-1061 Instrument Calibration\n V-1062 System Calibration\n V-1070 Test\n V-1071 Scanning Rate\n V-1072 Scanning Direction\n V-1073 Scanning Distance\n V-1074 Leakage Detection\n V-1075 Flow Rate\n V-1080 Evaluation\n V-1081 Leakage\n V-1082 Repair/Retest\n Mandatory Appendix VI Pressure Change Test\n VI-1010 Scope\n VI-1020 General\n VI-1021 Written Procedure Requirements\n VI-1030 Equipment\n VI-1031 Pressure Measuring Instruments\n VI-1032 Temperature Measuring Instruments\n VI-1060 Calibration\n VI-1061 Pressure Measuring Instruments\n VI-1062 Temperature Measuring Instruments\n VI-1070 Test\n VI-1071 Pressure Application\n VI-1072 Vacuum Application\n VI-1073 Test Duration\n VI-1074 Small Pressurized Systems\n VI-1075 Large Pressurized Systems\n VI-1076 Start of Test\n VI-1077 Essential Variables\n VI-1080 Evaluation\n VI-1081 Acceptable Test\n VI-1082 Rejectable Test\n Mandatory Appendix VII Glossary of Terms for Leak Testing\n Mandatory Appendix VIII Thermal Conductivity Detector Probe Test\n VIII-1010 Introduction and Scope\n VIII-1011 Thermal Conductivity Leak Detectors\n VIII-1020 General\n VIII-1021 Written Procedure Requirements\n VIII-1030 Equipment\n VIII-1031 Tracer Gas\n VIII-1032 Instrument\n VIII-1033 Calibration Leak Standard\n VIII-1060 Calibration\n VIII-1061 Standard Leak Size\n VIII-1062 Warm Up\n VIII-1063 Scanning Rate\n VIII-1064 Detection Time\n VIII-1065 Frequency and Sensitivity\n VIII-1070 Test\n VIII-1071 Location of Test\n VIII-1072 Concentration of Tracer Gas\n VIII-1073 Soak Times\n VIII-1074 Scanning Distance\n VIII-1075 Scanning Rate\n VIII-1076 Scanning Direction\n VIII-1077 Leakage Detection\n VIII-1078 Application\n VIII-1080 Evaluation\n VIII-1081 Leakage\n VIII-1082 Repair/Retest\n Mandatory Appendix IX Helium Mass Spectrometer Test — Hood Technique\n IX-1010 Scope\n IX-1020 General\n IX-1021 Written Procedure Requirements\n IX-1030 Equipment\n IX-1031 Instrument\n IX-1032 Auxiliary Equipment\n IX-1033 System Calibration Leak Standard\n IX-1050 Technique\n IX-1051 Permeation\n IX-1052 Repetitive or Similar Tests\n IX-1060 Calibration\n IX-1061 Instrument Calibration\n IX-1062 System Calibration\n IX-1070 Test\n IX-1071 Standard Technique\n IX-1072 Alternative Technique\n IX-1080 Evaluation\n IX-1081 Leakage\n IX-1082 Repair/Retest\n Mandatory Appendix X Ultrasonic Leak Detector Test\n X-1010 Introduction\n X-1020 General\n X-1021 Written Procedure Requirements\n X-1030 Equipment\n X-1031 Instrument\n X-1032 Capillary Calibration Leak Standard\n X-1060 Calibration\n X-1061 Standard Leak Size\n X-1062 Warm Up\n X-1063 Scanning Rate\n X-1064 Frequency and Sensitivity\n X-1070 Test\n X-1071 Location of Test\n X-1072 Soak Time\n X-1073 Scanning Distance\n X-1074 Scanning Rate\n X-1075 Leakage Detection\n X-1080 Evaluation\n X-1081 Leakage\n X-1082 Repair/Retest\n Nonmandatory Appendix A Supplementary Leak Testing Equation Symbols\n A-1010 Applicability of the Formulas\n Article 11 Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels\n T-1110 Scope\n T-1120 General\n T-1121 Vessel Conditioning\n T-1122 Vessel Loading\n T-1123 Vessel Support\n T-1124 Environmental Conditions\n T-1125 Noise Elimination\n T-1126 Instrumentation Settings\n T-1127 Sensors\n T-1128 Procedure Requirements\n T-1130 Equipment\n T-1160 Calibration\n T-1161 System Calibration\n T-1162 Sensor Locations and Spacings\n T-1163 Systems Performance Check\n T-1170 Examination\n T-1171 General Guidelines\n T-1172 Background Noise\n T-1173 Loading\n T-1174 AE Activity\n T-1175 Test Termination\n T-1180 Evaluation\n T-1181 Evaluation Criteria\n T-1182 Emissions During Load Hold, EH\n T-1183 Felicity Ratio Determination\n T-1184 High Amplitude Events Criterion\n T-1185 Total Counts Criterion\n T-1190 Documentation\n T-1191 Report\n T-1192 Record\n Mandatory Appendix I Instrumentation Performance Requirements\n I-1110 AE Sensors\n I-1111 High Frequency Sensors\n I-1112 Low Frequency Sensors\n I-1120 Signal Cable\n I-1130 Couplant\n I-1140 Preamplifier\n I-1150 Filters\n I-1160 Power-Signal Cable\n I-1161 Power Supply\n I-1170 Main Amplifier\n I-1180 Main Processor\n I-1181 General\n I-1182 Peak Amplitude Detection\n I-1183 Signal Outputs and Recording\n Mandatory Appendix II Instrument Calibration\n II-1110 General\n II-1120 Threshold\n II-1130 Reference Amplitude Threshold\n II-1140 Count Criterion Nc and AM Value\n II-1150 Measurement of M\n II-1160 Field Performance\n Mandatory Appendix III Glossary of Terms for Acoustic Emission Examination of Fiber-Reinforced Plastic Vessels\n Nonmandatory Appendix A Sensor Placement Guidelines\n Article 12 Acoustic Emission Examination of Metallic Vessels During Pressure Testing\n T-1210 Scope\n T-1220 General\n T-1221 Vessel Stressing\n T-1222 Noise Reduction\n T-1223 Sensors\n T-1224 Location of Acoustic Emission Sources\n T-1225 Procedure Requirements\n T-1230 Equipment\n T-1260 Calibration\n T-1261 System Calibration\n T-1262 On-Site System Calibration\n T-1263 Attenuation Characterization\n T-1264 Sensor Location\n T-1265 Sensor Spacing\n T-1266 Systems Performance Check\n T-1270 Examination\n T-1271 General Guidelines\n T-1272 Background Noise\n T-1273 Vessel Pressurization\n T-1280 Evaluation\n T-1281 Evaluation Criteria\n T-1290 Documentation\n T-1291 Written Report\n T-1292 Record\n Mandatory Appendix I Instrumentation Performance Requirements\n I-1210 Acoustic Emission Sensors\n I-1220 Signal Cable\n I-1230 Couplant\n I-1240 Preamplifier\n I-1250 Filter\n I-1260 Power-Signal Cable\n I-1270 Power Supply\n I-1280 Main Amplifier\n I-1290 Main Processor\n I-1291 General\n I-1292 Peak Amplitude Detection\n Mandatory Appendix II Instrument Calibration and Cross-Referencing\n II-1210 Manufacturer’s Calibration\n II-1211 Annual Calibration\n II-1220 Instrument Cross-Referencing\n II-1221 Sensor Characterization\n Mandatory Appendix III Glossary of Terms for Acoustic Emission Examination of Metal Pressure Vessels\n Nonmandatory Appendix A Sensor Placement Guidelines\n Nonmandatory Appendix B Supplemental Information for Conducting Acoustic Emission Examinations\n B-1210 Frequency Selection\n B-1220 Combining More Than One Sensor in a Single Channel\n B-1230 Attenuative Welds\n B-1240 Production Line Testing of Identical Vessels\n Article 13 Continuous Acoustic Emission Monitoring of Pressure Boundary Components\n T-1310 Scope\n T-1311 References\n T-1320 General\n T-1321 Relevant Indications\n T-1322 Personnel Qualification\n T-1323 Written Procedures\n T-1330 Equipment\n T-1331 General\n T-1332 AE Sensors\n T-1333 Signal Cables\n T-1334 Amplifiers\n T-1335 AE Instrument and Monitor\n T-1340 Miscellaneous Requirements\n T-1341 Equipment Verification\n T-1342 Sensor Calibration\n T-1343 Signal Pattern Recognition\n T-1344 Material Attenuation/Characterization\n T-1345 Background Noise\n T-1346 Verification Records\n T-1347 Sensor Installation\n T-1348 Signal Lead Installation\n T-1349 AE Monitor Installation\n T-1350 Technique/Procedure Requirements\n T-1351 AE System Operation\n T-1352 Data Processing, Interpretation, and Evaluation\n T-1353 Data Recording and Storage\n T-1354 Component Loading\n T-1355 Noise Interference\n T-1356 Coordination with Plant System Owner/Operator\n T-1357 Source Location and Sensor Mounting\n T-1360 Calibration\n T-1361 Sensors\n T-1362 Complete AE Monitor System\n T-1363 Verification Intervals\n T-1364 Verification Records\n T-1370 Examination\n T-1371 Plant Startup and Shutdown\n T-1373 Plant Steady-State Operation\n T-1374 Nuclear Metal Components\n T-1375 Non-Nuclear Metal Components\n T-1376 Nonmetallic Components\n T-1377 Limited Zone Monitoring\n T-1378 Hostile Environment Applications\n T-1379 Leak Detection Applications\n T-1380 Evaluation/Results\n T-1381 Data Processing, Interpretation, and Evaluation\n T-1382 Data Requirements\n T-1390 Reports/Records\n T-1391 Reports to Plant System Owner/Operator\n T-1392 Records\n T-1393 Record Retention Requirements\n Mandatory Appendix I Nuclear Components\n I-1310 Scope\n I-1330 Equipment\n I-1331 Preamplifiers\n I-1332 AE Sensors\n I-1333 Frequency Response\n I-1334 Signal Processing\n I-1340 Miscellaneous Requirements\n I-1341 Equipment Qualification\n I-1360 Calibration\n I-1361 Calibration Block\n I-1362 Calibration Interval\n I-1380 Evaluation\n Mandatory Appendix II Non-Nuclear Metal Components\n II-1310 Scope\n II-1330 Equipment\n II-1331 Sensors\n II-1333 Amplifiers\n II-1334 Main Processor\n II-1360 Calibration\n II-1361 System Performance Check\n II-1362 System Performance Check Verification\n II-1380 Evaluation\n II-1381 Evaluation Criteria — Zone Location\n II-1382 Evaluation Criteria — Multisource Location\n Mandatory Appendix III Nonmetallic Components\n III-1310 Scope\n III-1320 General\n III-1321 Applications\n III-1330 Equipment\n III-1331 Sensors\n III-1332 Source Location Accuracy\n III-1360 Calibration\n III-1361\n III-1362\n III-1363\n III-1364\n III-1380 Evaluation\n III-1381 Evaluation Criteria\n III-1382 Source Mechanism\n Mandatory Appendix IV Limited Zone Monitoring\n IV-1310 Scope\n IV-1320 General\n IV-1321 Guard Sensor Technique\n IV-1340 Miscellaneous Requirements\n IV-1341 Redundant Sensors\n IV-1350 Technique\n IV-1351 Techniques\n IV-1352 Procedure\n IV-1353 Other Techniques\n IV-1360 Calibration\n IV-1380 Evaluation\n IV-1390 Documentation\n Mandatory Appendix V Hostile Environment Applications\n V-1310 Scope\n V-1330 Equipment\n V-1331 AE Sensors\n V-1332 AE Sensor Types\n V-1333 Waveguide\n V-1334 AE Signal Transmission\n V-1340 Miscellaneous Requirements\n V-1341 Sensor Mounting\n Mandatory Appendix VI Leak Detection Applications\n VI-1310 Scope\n VI-1320 General\n VI-1330 Equipment\n VI-1331 Sensor Type\n VI-1332 Waveguide\n VI-1333 Electronic Filters\n VI-1350 Technique\n VI-1351 Procedure\n VI-1360 Calibration\n VI-1361 Calibration Checks\n VI-1370 Examination\n VI-1371 Implementation of System Requirements\n VI-1372 Verification Procedure\n VI-1373 Equipment Qualification and Calibration Data\n VI-1380 Evaluation\n VI-1381 Leak Indications\n VI-1382 Leak Location\n Mandatory Appendix VII Glossary of Terms for Acoustic Emission Examination\n Article 14 Examination System Qualification\n T-1410 Scope\n T-1420 General Requirements\n T-1421 The Qualification Process\n T-1422 Technical Justification\n T-1423 Performance Demonstration\n T-1424 Levels of Rigor\n T-1425 Planning a Qualification Demonstration\n T-1430 Equipment\n T-1440 Application Requirements\n T-1441 Technical Justification Report\n T-1442 Performance Demonstration\n T-1443 Examination System Requalification\n T-1450 Conduct of Qualification Demonstration\n T-1451 Protocol Document\n T-1452 Individual Qualification\n T-1460 Calibration\n T-1470 Examination\n T-1471 Intermediate Rigor Detection Test\n T-1472 High Rigor Detection Tests\n T-1480 Evaluation\n T-1490 Documentation and Records\n Mandatory Appendix I Glossary of Terms for Examination System Qualification\n Mandatory Appendix II UT Performance Demonstration Criteria\n II-1410 Scope\n II-1420 General\n II-1430 Equipment\n II-1434 Qualification Blocks\n II-1440 Application Requirements\n II-1450 Conduct of Qualification Demonstration\n II-1460 Calibration\n II-1470 Examination\n II-1480 Evaluation\n II-1481 Low Level\n II-1482 Intermediate Level\n II-1483 High Level\n II-1490 Documentation\n Article 15 Alternating Current Field Measurement Technique (ACFMT)\n T-1510 Scope\n T-1520 General\n T-1521 Supplemental Requirements\n T-1522 Written Procedure Requirements\n T-1530 Equipment\n T-1531 Instrument\n T-1532 Probes\n T-1533 Calibration Blocks\n T-1540 Miscellaneous Requirements\n T-1541 Surface Conditioning\n T-1542 Demagnetization\n T-1543 Identification of Weld Examination Areas\n T-1560 Calibration\n T-1561 General Requirements\n T-1562 Calibration\n T-1563 Performance Confirmation\n T-1570 Examination\n T-1571 General Examination Requirements\n T-1572 Examination Coverage\n T-1573 Overlap\n T-1574 Interpretation\n T-1580 Evaluation\n T-1590 Documentation\n T-1591 Recording Indication\n T-1592 Examination Record\n T-1593 Report\n Article 16 Magnetic Flux Leakage (MFL) Examination\n T-1610 Scope\n T-1620 General\n T-1621 Personnel Qualification Requirements\n T-1622 Equipment Qualification Requirements\n T-1623 Written Procedure Requirements\n T-1630 Equipment\n T-1640 Requirements\n T-1650 Calibration\n T-1660 Examination\n T-1670 Evaluation\n T-1680 Documentation\n Article 17 Remote Field Testing (RFT) Examination Method\n T-1710 Scope\n T-1720 General\n T-1721 Written Procedure Requirements\n T-1722 Personnel Requirements\n T-1730 Equipment\n T-1750 Technique\n T-1760 Calibration\n T-1761 Instrument Calibration\n T-1762 System Preparation\n T-1763 System Setup and Calibration\n T-1764 Auxiliary Frequency(ies) Calibration Procedure\n T-1765 Calibration Confirmation\n T-1766 Correlation of Signals to Estimate Depth of Flaws\n T-1770 Examination\n T-1771 General\n T-1772 Probe Speed\n T-1780 Evaluation\n T-1790 Documentation\n T-1793 Record Retention\n Article 18 Acoustic Pulse Reflectometry (APR) Examination\n T-1810 Scope\n T-1820 General\n T-1821 Written Procedure Requirements\n T-1830 Equipment\n T-1831 Instrumentation\n T-1832 Reference Specimen\n T-1840 Miscellaneous Requirements\n T-1841 Tube or Pipe Precleaning\n T-1850 Prior to the Examination\n T-1860 Calibration\n T-1861 Instrument Calibration\n T-1862 System Preparation\n T-1863 System Setup\n T-1864 Functional Test\n T-1865 Analysis of Signals to Determine Flaw Type and Estimate Flaw Size\n T-1870 Examination\n T-1880 Evaluation\n T-1890 Documentation\n T-1891 Recording Indications\n T-1892 Examination Records\n T-1893 Storage Media\n Article 19 Guided Wave Examination Method for Piping\n T-1910 Scope\n T-1920 General\n T-1921 Written Procedure Requirements\n T-1922 Personnel Qualification\n T-1930 Equipment\n T-1931 Instrumentation Requirements\n T-1932 Sensors\n T-1950 Wave Modes\n T-1951 Miscellaneous Requirements\n T-1960 Calibration\n T-1961 Instrument Calibration\n T-1962 System Calibration\n T-1963 Distance–Amplitude Correction (DAC) or Time-Corrected Gain (TCG)\n T-1964 Detection Threshold\n T-1965 Call Level\n T-1970 Examination\n T-1971 Examination Coverage\n T-1980 Evaluation\n T-1981 General\n T-1982 Evaluation Level\n T-1990 Documentation\n T-1992 Examination Records\n Nonmandatory Appendix A Operation of GWT Systems\n A-1910 Scope\n A-1920 General\n A-1921 Call Level\n A-1922 Effect of Pipe Geometry on Examination Range\n A-1923 Effect of Pipe Coating\n A-1924 Effect of General Corrosion on Examination Range\n A-1925 Special Applications of Guided Wave Testing\nSubsection B Documents Adopted by Section V\n Article 22 Radiographic Standards\n SE-94\n SE-747\n SE-999\n SE-1025\n SE-1030\n SE-1114\n SE-1165\n SE-1255\n SE-1416\n SE-1647\n Article 23 Ultrasonic Standards\n SA-388/SA-388M\n SA-435/SA-435M\n SA-577/SA-577M\n SA-578/SA-578M\n SA-609/SA-609M\n SA-745/SA-745M\n SB-548\n SD-7091\n SE-213\n SE-273\n SE-797/SE-797M\n SE-2491\n SE-2700\n Article 24 Liquid Penetrant Standards\n SD-129\n SD-516\n SD-808\n SE-165/SE-165M\n SE-2297\n SE-3022\n Article 25 Magnetic Particle Standards\n SD-1186\n SE-709\n Article 26 Eddy Current Standards\n SE-243\n Article 29 Acoustic Emission Standards\n SE-650/SE-650M\n SE-750\n SE-976\n SE-1067/SE-1067M\n SE-1118/SE-1118M\n SE-1139\n SE-1211/SE-1211M\n SE-1419/SE-1419M\n SE-2075/SE-2075M\n Article 30 Terminology for Nondestructive Examinations Standard\n SE-1316\n Article 31 Alternating Current Field Measurement Standard\n SE-2261/SE-2261M\n Article 32 Remote Field Testing Standard\n SE-2096/SE-2096M\n Article 33 Guided Wave Standards\n SE-2775\n SE-2929\nMandatory Appendices\n Mandatory Appendix II Standard Units for Use in Equations\nNonmandatory Appendices\n Nonmandatory Appendix A Guidance for the Use of U.S. Customary and SI Units in the ASME Boiler and Pressure Vessel Code\n A-1 Use of Units in Equations\n A-2 Guidelines Used to Develop SI Equivalents\n A-3 Soft Conversion Factors\nFigures\n T-275 Location Marker Sketches\n I-263 Beam Width Determination\n VI-A-1 Reference Film\n IX-263 Beam Width Determination\n A-210-1 Single-Wall Radiographic Techniques\n C-210-1 Side and Top Views of Hole-Type IQI Placements\n C-210-2 Side and Top Views of Hole-Type IQI Placements\n C-210-3 Side and Top Views of Hole-Type IQI Placements\n C-210-4 Side and Top Views of Hole-Type IQI Placements\n D-210-1 Complete Circumference Cylindrical Component\n D-210-2 Section of Circumference 240 deg or More Cylindrical Component (Example is Alternate Intervals)\n D-210-3 Section(s) of Circumference Less Than 240 deg Cylindrical Component\n D-210-4 Section(s) of Circumference Equal to or More Than 120 deg and Less Than 240 deg Cylindrical Component Option\n D-210-5 Complete Circumferential Welds Spherical Component\n D-210-6 Welds in Segments of Spherical Component\n D-210-7 Plan View A-A\n D-210-8 Array of Objects in a Circle\n T-434.1.7.2 Ratio Limits for Curved Surfaces\n T-434.2.1 Nonpiping Calibration Blocks\n T-434.3-1 Calibration Block for Piping\n T-434.3-2 Alternate Calibration Block for Piping\n T-434.4.1 Calibration Block for Technique One\n T-434.4.2.1 Alternate Calibration Block for Technique One\n T-434.4.2.2 Alternate Calibration Block for Technique One\n T-434.4.3 Calibration Block for Technique Two\n T-434.5.1 Calibration Block for Straight Beam Examination of Nozzle Side Weld Fusion Zone and/or Adjacent Nozzle Parent Metal\n I-440 Linearity\n III-434.2.1(a) TOFD Reference Block\n III-434.2.1(b) Two-Zone Reference Block Example\n III-463.5 Offset Scans\n X-471.1 Fusion Pipe Joint Examination Volume\n B-461.1 Sweep Range (Side-Drilled Holes)\n B-461.2 Sweep Range (IIW Block)\n B-461.3 Sweep Range (Notches)\n B-462.1 Sensitivity and Distance–Amplitude Correction (Side-Drilled Holes)\n B-462.3 Sensitivity and Distance–Amplitude Correction (Notches)\n B-464 Position Depth and Beam Path\n B-465 Planar Reflections\n B-466 Beam Spread\n C-461 Sweep Range\n C-462 Sensitivity and Distance–Amplitude Correction\n D-490 Search Unit Location, Position, and Beam Direction\n E-460.1 Lateral Resolution and Depth Discrimination Block for 45 deg and 60 deg Applications\n E-460.2 Lateral and Depth Resolution Block for 0 deg Applications\n G-461(a) Critical Radius, RC, for Transducer/Couplant Combinations\n G-461(b) Correction Factor (Gain) for Various Ultrasonic Examination Parameters\n J-431 Basic Calibration Block\n L-432 Example of a Flat Demonstration Block Containing Three Notches\n M-461.1 Sweep Range (Side-Drilled Holes)\n M-461.2 Sweep Range (Cylindrical Surfaces)\n M-461.3 Sweep Range (Straight Beam Search Unit)\n M-462 Sensitivity and Distance–Amplitude Correction\n N-421(a) Schematic Showing Waveform Transformation Into Grayscale\n N-421(b) Schematic Showing Generation of Grayscale Image From Multiple A-Scans\n N-421(c) Schematic Showing Standard TOFD Setup and Display With Waveform and Signal Phases\n N-421(d) TOFD Display With Flaws and Displayed A-Scan\n N-451 Measurement Tools for Flaw Heights\n N-452(a) Schematic Showing the Detection of Off-Axis Flaws\n N-452(b) Measurement Errors From Flaw Position Uncertainty\n N-453 TOFD Image Showing Hyperbolic “Tails” From the Ends of a Flaw Image Used to Measure Flaw Length\n N-454(a) TOFD Image Showing Top and Bottom Diffracted Signals From Midwall Flaw and A-Scan Interpretation\n N-454(b) TOFD Image Showing Top and Bottom Diffracted Signals From Centerline Crack and A-Scan Interpretation\n N-481(a) Schematics of Image Generation, Scan Pattern, Waveform, and TOFD Display Showing the Image of the Point Flaw\n N-481(b) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Inside (ID) Surface-Breaking Flaw\n N-481(c) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Outside (OD) Surface-Breaking Flaw\n N-481(d) Schematics of Flaw Location, Signals, and TOFD Display Showing the Image of the Midwall Flaw\n N-481(e) Flaw Location and TOFD Display Showing the Image of the Lack of Root Penetration\n N-481(f) Flaw Location and TOFD Display Showing the Image of the Concave Root Flaw\n N-481(g) Flaw Location, TOFD Display Showing the Image of the Midwall Lack of Fusion Flaw, and the A-Scan\n N-481(h) Flaw Location and TOFD Display Showing the Image of the Porosity\n N-481(i) Flaw Location and TOFD Display Showing the Image of the Transverse Crack\n N-481(j) Schematics of Image Generation, Flaw Location, and TOFD Display Showing the Image of the Interpass Lack of Fusion\n N-482(a) Schematic of Flaw Locations and TOFD Image Showing the Lateral Wave, Backwall, and Three of the Four Flaws\n N-482(b) Schematic of Flaw Locations and TOFD Display Showing the Lateral Wave, Backwall, and Four Flaws\n N-483(a) Acceptable Noise Levels, Flaws, Lateral Wave, and Longitudinal Wave Backwall\n N-483(b) TOFD Image With Gain Too Low\n N-483(c) TOFD Image With Gain Set Too High\n N-483(d)(1) TOFD Image With the Gate Set Too Early\n N-483(d)(2) TOFD Image With the Gate Set Too Late\n N-483(d)(3) TOFD Image With the Gate Set Too Long\n N-483(e) TOFD Image With Transducers Set Too Far Apart\n N-483(f) TOFD Image With Transducers Set Too Close Together\n N-483(g) TOFD Image With Transducers not Centered on the Weld Axis\n N-483(h) TOFD Image Showing Electrical Noise Interference\n O-470(a) Example of a Single Zone TOFD Setup\n O-470(b) Example of a Two Zone TOFD Setup (Equal Zone Heights)\n O-470(c) Example of a Three Zone TOFD Setup (Unequal Zone Heights With Zone 3 Addressed by Two Offset Scans)\n O-470(d) Example of a Four Zone TOFD Setup (Equal Zone Heights)\n P-421-1 Black and White (B&W) Version of Color Palette\n P-421-2 Scan Pattern Format\n P-421-3 Example of an E-Scan Image Display\n P-421-4 Example of an S-Scan Image Display\n P-452.1 Flaw Length Sizing Using Amplitude Drop Technique and the Vertical Cursors on the C-Scan Display\n P-452.2-1 Scan Showing Flaw Height Sizing Using Amplitude Drop Technique and the Horizontal Cursors on the B-Scan Display\n P-452.2-2 Flaw Height Sizing Using Top Diffraction Technique and the Horizontal Cursors on the S-Scan Display\n P-481 S-Scan of I.D. Connected Crack\n P-481.1 E-Scan of LOF in Midwall\n P-481.2 S-Scan of Porosity, Showing Multiple Reflectors\n P-481.3 O.D. Toe Crack Detected Using S-Scan\n P-481.4 IP Signal on S-Scan, Positioned on Root\n P-481.5 Slag Displayed as a Midwall Defect on S-Scan\n Q-410 Distance–Amplitude Correction\n Q-421 First DAC Curve\n Q-422 Second DAC Curve\n R-434-1 Corner Weld Example\n R-434-2 Tee Weld Example\n T-534.3 Straight Beam Calibration Blocks for Bolting\n III-630 Liquid Penetrant Comparator\n T-754.2.1 Single-Pass and Two-Pass Central Conductor Technique\n T-754.2.2 The Effective Region of Examination When Using an Offset Central Conductor\n T-764.2(a) Pie-Shaped Magnetic Particle Field Indicator\n T-764.2(b)(1) Artificial Flaw Shims\n T-764.2(b)(2) Artificial Flaw Shims\n T-766.1 Ketos (Betz) Test Ring\n II-860.3.1 Differential Technique Response From Calibration Reference Standard\n II-860.3.2 Absolute Technique Response From Calibration Reference Standard\n II-880 Flaw Depth as a Function of Phase Angle at 400 kHz [Ni–Cr–Fe 0.050 in. (1.24 mm) Wall Tube]\n V-860 Typical Lift-off Calibration Curve for Coating Thickness Showing Thickness Calibration Points Along the Curve\n VI-832 Reference Specimen\n VI-850 Impedance Plane Representations of Indications From Figure VI-832\n VII-830.5 Eddy Current Reference Specimen\n VII-862 Impedance Plane Responses for Stainless Steel and Carbon Steel Reference Specimens\n VIII-864.1 Differential Technique Response From Calibration Reference\n VIII-864.2 Absolute Technique From Calibration Reference Standard\n T-1173(a)(1) Atmospheric Vessels Loading Sequence\n T-1173(a)(2) Vacuum Vessels Loading Sequence\n T-1173(a)(3) Test Algorithm — Flowchart for Atmospheric Vessels\n T-1173(b)(1) Pressure Vessel Loading Sequence\n T-1173(b)(2) Algorithm — Flowchart for Pressure Vessels\n I-1183 Sample of Schematic of AE Instrumentation for Vessel Examination\n A-1110 Case 1 — Atmospheric Vertical Vessel\n A-1120 Case 2 — Atmospheric Vertical Vessel\n A-1130 Case 3 — Atmospheric/Pressure Vessel\n A-1140 Case 4 — Atmospheric/Pressure Vertical Vessel\n A-1150 Case 5 — Atmospheric/Vacuum Vertical Vessel\n A-1160 Case 6 — Atmospheric/Pressure Horizontal Tank\n T-1273.2.1 An Example of Pressure Vessel Test Stressing Sequence\n T-1273.2.2 An Example of In-Service, Pressure Vessel, Test Loading Sequence\n A-1210 Case 1 — Vertical Pressure Vessel Dished Heads, Lug or Leg Supported\n A-1220 Case 2 — Vertical Pressure Vessel Dished Heads, Agitated, Baffled Lug, or Leg Support\n A-1230 Case 3 — Horizontal Pressure Vessel Dished Heads, Saddle Supported\n A-1240 Case 4 — Vertical Pressure Vessel Packed or Trayed Column Dished Heads, Lug or Skirt Supported\n A-1250 Case 5 — Spherical Pressure Vessel, Leg Supported\n T-1331 Functional Flow Diagram — Continuous AE Monitoring System\n T-1332.2 Response of a Waveguide AE Sensor Inductively Tuned to 500 kHz\n V-1333 Metal Waveguide AE Sensor Construction\n V-1341 Mounting Fixture for Steel Waveguide AE Sensor\n II-1434 Flaw Characterization for Tables II-1434-1 and II-1434-2\n T-1533 ACFMT Calibration Block\n T-1622.1.1 Reference Plate Dimensions\n T-1622.1.2 Reference Pipe or Tube Dimensions\n T-1762 Pit Reference Tube (Typical)\n T-1763.1(a) Voltage Plane Display of Differential Channel Response for Through-Wall Hole (Through-Hole Signal) and 20% Groove Showing Preferred Angular Relationship\n T-1763.1(b) Voltage Plane Display of Differential Channel Response for the Tube Support Plate (TSP), 20% Groove, and Through-Wall Hole (Through-Hole Signal)\n T-1763.2 Reference Curve and the Absolute Channel Signal Response From Two Circumferential Grooves and a Tube Support Plate\n T-1832 Reference Specimens\n T-1865.1 Signal Analysis From Various Types of Discontinuities\n T-1865.2 Reflection From a Through-Wall Hole\n A-1920 Illustration of the Guided Wave Examination Procedure\nTables\n II-121-1 Initial Training and Experience Requirements for CR and DR Techniques\n II-121-2 Additional Training and Experience Requirements for PAUT and TOFD Ultrasonic Techniques\n II-122.1 Minimum CR and DR Examination Questions\n II-122.2 Minimum Ultrasonic Technique Examination Questions\n A-110 Imperfection vs. Type of NDE Method\n T-233.1 Hole-Type IQI Designation, Thickness, and Hole Diameters\n T-233.2 Wire IQI Designation, Wire Diameter, and Wire Identity\n T-276 IQI Selection\n T-283 Equivalent Hole-Type IQI Sensitivity\n A-210-2 Double-Wall Radiographic Techniques\n T-421 Requirements of an Ultrasonic Examination Procedure\n III-421 Requirements of a TOFD Examination Procedure\n IV-421 Requirements of a Phased Manual Raster Scanning Examination Procedure Using Linear Arrays\n V-421 Requirements of a Phased Array Linear Scanning Examination Procedure Using Linear Arrays\n VII-421 Requirements of an Ultrasonic Examination Procedure for Workmanship-Based Acceptance Criteria\n VIII-421 Requirements of an Ultrasonic Examination Procedure for Fracture-Mechanics-Based Acceptance Criteria\n X-421 Requirements of an Ultrasonic Examination Procedure for HDPE Techniques\n D-490 Example Data Record\n G-461 Transducer Factor F1 for Various Ultrasonic Transducer Diameters and Frequencies\n O-432(a) Search Unit Parameters for Single Zone Examinations Up to 3 in. (75 mm)\n O-432(b) Search Unit Parameters for Multiple Zone Examinations Up to 12 in. (300 mm) Thick\n O-470 Recommended TOFD Zones for Butt Welds Up to 12 in. (300 mm) Thick\n T-522 Variables of an Ultrasonic Examination Procedure\n T-621.1 Requirements of a Liquid Penetrant Examination Procedure\n T-621.3 Minimum and Maximum Time Limits for Steps in Penetrant Examination Procedures\n T-672 Minimum Dwell Times\n T-721 Requirements of a Magnetic Particle Examination Procedure\n I-721 Requirements of AC Yoke Technique on Coated Ferritic Component\n III-721 Requirements for an AC or HWDC Yoke Technique With Fluorescent Particles in an Undarkened Area\n IV-721 Requirements for Qualifying Alternate Wavelength Light Sources for Excitation of Specific Fluorescent Particles\n V-721 Requirements for the Magnetic Rubber Examination Procedure\n II-821 Requirements for an Eddy Current Examination Procedure\n IV-823 Requirements of an External Coil Eddy Current Examination Procedure\n V-821 Requirements of an Eddy Current Examination Procedure for the Measurement of Nonconductive-Nonferromagnetic Coating Thickness on a Metallic Material\n VI-821 Requirements of an Eddy Current Examination Procedure for the Detection and Measurement of Depth for Surface Discontinuities in Nonferromagnetic Metallic Materials\n VII-823 Requirements of an Eddy Current Surface Examination Procedure\n VIII-821 Requirements for an Eddy Current Examination Procedure\n T-921 Requirements of a Visual Examination Procedure\n I-1021 Requirements of a Direct Pressure Bubble Leak Testing Procedure\n II-1021 Requirements of a Vacuum Box Leak Testing Procedure\n III-1021 Requirements of a Halogen Diode Detector Probe Testing Procedure\n III-1031 Tracer Gases\n IV-1021 Requirements of a Helium Mass Spectrometer Detector Probe Testing Procedure\n V-1021 Requirements of a Helium Mass Spectrometer Tracer Probe Testing Procedure\n VI-1021 Requirements of a Pressure Change Testing Procedure\n VIII-1021 Requirements of a Thermal Conductivity Detector Probe Testing Procedure\n VIII-1031 Tracer Gases\n IX-1021 Requirements of a Helium Mass Spectrometer Hood Testing Procedure\n X-1021 Requirements of an Ultrasonic Leak Testing Procedure\n T-1121 Requirements for Reduced Operating Level Immediately Prior to Examination\n T-1181 Evaluation Criteria\n T-1281 An Example of Evaluation Criteria for Zone Location\n II-1381 An Example of Evaluation Criteria for Zone Location\n II-1382 An Example of Evaluation Criteria for Multisource Location\n T-1472.1 Total Number of Samples for a Given Number of Misses at a Specified Confidence Level and POD\n T-1472.2 Required Number of First Stage Examiners vs. Target Pass Rate\n II-1434-1 Flaw Acceptance Criteria for 4-in. to 12-in. Thick Weld\n II-1434-2 Flaw Acceptance Criteria for Larger Than 12-in. Thick Weld\n T-1522 Requirements of an ACFMT Examination Procedure\n T-1623 Requirements of an MFL Examination Procedure\n T-1721 Requirements of an RFT Examination Procedure\n T-1821 Requirements of an Acoustic Pulse Reflectometry Examination Procedure\n T-1921.1 Requirements of a GWT Examination Procedure\n II-1 Standard Units for Use in Equations\nEndnotes